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·
PhD Student
,
imec
2022–
·
Master of Engineering: Computer Science
,
KU Leuven
2022–2026
·
PhD Student
,
KU Leuven
2022–
·
Intern
,
Nokia Bell Labs
2021–
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Intern
,
imec
2020–2022
·
Bachelor of Engineering
,
KU Leuven
2017–2020
Publications
(28)
Code Generation Using Machine Learning: A Systematic Review
IEEE Access · 2022
48
cited
EELWORM: a bioinspired multimodal amphibious soft robot
International Conference on Soft Robotics · 2020
29
cited
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach
Metrology, Inspection, and Process Control XXXVI · 2022
22
cited
Optimizing YOLOv7 for semiconductor defect detection
Advanced Lithography · 2023
21
cited
YOLOv8 for defect inspection of hexagonal directed self-assembly patterns: a data-centric approach
European Mask and Lithography Conference · 2023
17
cited
Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5
Photomask Technology · 2022
15
cited
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation
ACM Symposium on Cloud Computing · 2023
14
cited
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review
arXiv.org · 2023
12
cited
SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering
Advanced Lithography · 2023
12
cited
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection
International Conference on Electronics, Circuits, and Systems · 2022
11
cited
Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review
Journal of Micro/Nanopatterning, Materials, and Metrology · 2024
10
cited
SEMI-CenterNet: a machine learning facilitated approach for semiconductor defect inspection
European Mask and Lithography Conference · 2023
7
cited
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization
International Symposium ELMAR · 2023
2
cited
A machine learning approach towards SKILL code autocompletion
Advanced Lithography · 2023
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Enrique Dehaerne | Researcher Profile | Sotabase | Sotabase